EIA Standards Projects
Below is the list and status of EIA Standards projects, organized by Committee, for the past 5 years. As part of the process of producing American National Standards, EIA standards are reviewed at least every 5 years and reaffirmed or revised. The EIA Standards Committee (ESC) strives for a balance of participants in each of its committees from three general categories; Users, Producers, and General Interest in the electronics and electrical industry.
Participation is open to all directly and materially interested parties of matters addressed by the work. The three Categories are: User, Producer, and General Interest. Presently, ECIA is specifically seeking additional participation in the User and General Interest categories. This typically includes, but is not limited to, OEMs, ODMs, Contract Manufacturers, and Electronics Distributors (User Category), as well individuals who have expertise in these areas but are not affiliated with a particular company in the industry (General Interest Category).
Please direct any questions concerning the programs to:
- Staff- Edward F. Mikoski Jr, CStd, FSES
- E-mail: emikoski@ecianow.org
- Phone: 571-323-0253
American National Standards in Development
Published American National Standards
ANSI Standards Action (weekly list of standards open for public comment)
EIA Standards Project (2022-10-03)
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Project Number and Title |
Project Status* |
Committee |
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5384 ACH Knowledge Base Articles |
Proj Initiated | Automated Component Handling Committee |
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5493 Proposed Knowledge Base Article - Small Components Sticking to Cover Tape |
Proj Initiated | Automated Component Handling Committee |
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5484 Review of EIA-960-B Assembly Component Tray - ACT |
Proposed | Automated Component Handling Committee |
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5494 Review of EIA-468-C |
Proposed | Automated Component Handling Committee |
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5483 Review of EIA-948 Component Tray for Automated Handling |
PINS | Automated Component Handling Committee |
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5491 Review of ACH Knowledge Base Articles |
Proj Initiated | Automated Component Handling Committee |
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5475 EIA-364-122 Safety Holes Test Procedure for Electrical Connectors |
PINS | CE-2 Electronic Connector Standards |
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5476 IEC Mixed Flowing Gas Project - CE-2 |
Proposed | CE-2 Electronic Connector Standards |
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5485 Revision of EIA-364-34 Ambient Condensation Test Procedure for Electrical Connectors and Sockets |
PINS | CE-2 Electronic Connector Standards |
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5492 Review of 7 Test Procedures (EIA-364-13E, -17C, -25E, -27C, -28F, -56E, -1005) |
Committee Ballot | CE-2 Electronic Connector Standards |
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5496 Review of 7 Test Procedures (EIA-364-02D, -06C, -23C, -34, -87B, -96A, -114) |
PINS | CE-2 Electronic Connector Standards |
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5497 Review of 6 Test Procedures (EIA-364-09D, -35C, -57A, -78C, -83A, -117) |
PINS | CE-2 Electronic Connector Standards |
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5479 EIA-364-123 High Temperature Exposure With Contact Loading Test Procedure for Electrical Connectors |
BSR8 | CE-2 Electronic Connector Standards |
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5486 Review of 6 Test Procedures |
BSR8 | CE-2 Electronic Connector Standards |
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549X Proposed new Test Procedure for the effect of de-icing fluid on connectors |
Proposed | CE-2 Electronic Connector Standards |
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5502 Proposed revision of EIA-364-G to review humidity levels |
Proposed | CE-2 Electronic Connector Standards |
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54XX Review of EIA-364-10J Fluid Immersion Test Procedure for Electrical Connectors |
Proposed | CE-2 Electronic Connector Standards |
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5XXX Review of EIA-364-11C Resistance to Solvents Test Procedure for Electrical Connectors and Sockets |
Proposed | CE-2 Electronic Connector Standards |
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5XXX |
Proposed | CE-2 Electronic Connector Standards |
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5420 Standardization Handbook of RF Transmission Lines and Fittings |
Proposed | CE-2.2 RF Connectors and Rigid Coax Connectors |
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5467 Review of EIA-225-A Rigid coaxial transmission lines 50 OHMs |
Proposed | CE-2.2 RF Connectors and Rigid Coax Connectors |
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5468 Revision of EIA-259-A Rigid coaxial transmission lines and connectors, 75 OHMs |
Proposed | CE-2.2 RF Connectors and Rigid Coax Connectors |
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5233 Resistive Devices Handbook - Rev |
Draft doc | P1 - Resistive Devices |
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5464 Review of EIA-887-A Thin Film Resistor Network Specification |
Proposed | P1 - Resistive Devices |
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5477 Revision of EIA-977 Test Method - Electronic Passive Components Exposure to Atmospheric Sulfur |
Proposed | P1 - Resistive Devices |
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EIA-198 Project Review |
Draft docs | P2-1 Ceramic Dielectric Capacitors |
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5362 - Temperature range used to establish temperature coefficient and operating temperature range |
Commenting | P2-1 Ceramic Dielectric Capacitors |
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5404 EIA-198 Parametric Conformance Tests |
Proposed | P2-1 Ceramic Dielectric Capacitors |
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5405 EIA-198 Environmental Performance Tests |
Proposed | P2-1 Ceramic Dielectric Capacitors |
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5406 EIA-198 Physical Performance Tests |
Proposed | P2-1 Ceramic Dielectric Capacitors |
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5409 EIA-198-1-G Ceramic Dielectric Capacitors Classes I, II, III and IV - Part I: Characteristics and Requirements |
Proposed | P2-1 Ceramic Dielectric Capacitors |
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5426 Review of IS-692 Ceramic Capacitor Qualification Specification |
Proposed | P2-1 Ceramic Dielectric Capacitors |
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5427 Revision of EIA-521-A Application Guide for Multilayer Ceramic Capacitors - Electrical |
Proposed | P2-1 Ceramic Dielectric Capacitors |
|
5471 Revision of EIA-198-3-E Ceramic Dielectric Capacitors Classes I, II, III and IV Part III: Individual Specifications |
Proposed | P2-1 Ceramic Dielectric Capacitors |
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5495 Review of EIA-469-E Test Method for Destructive Physical Analysis (DPA) of Ceramic Monolithic Capacitors |
Proposed | P2-1 Ceramic Dielectric Capacitors |
|
5481 Review of EIA-198-3-10 Multilayer (Monolithic), Unencapsulated, Ceramic Dielectric, Surface-Mount Low Induction Chip Capacitors and Multi-Terminal Low Induction Capacitors |
BSR8 | P2-1 Ceramic Dielectric Capacitors |
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5424 Update EIA-809 Solid Tantalum Capacitor Application Guideline |
Proposed | P2-5 Solid Electrolytic Capacitors (Tantalum, Niobium, Aluminum) |
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5425 Review of EIA-717-A Surface Mount Tantalum Capacitor Qualification Specification |
Proposed | P2-5 Solid Electrolytic Capacitors (Tantalum, Niobium, Aluminum) |
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5456 Review of EIA-456-A Metallized Film Dielectric Capacitors for Alternating Current Application |
BSR8 | P2-5 Solid Electrolytic Capacitors (Tantalum, Niobium, Aluminum) |
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5466 Review of EIA-757-A Visual and Mechanical Inspection for Molded SMT Solid Tantalum Capacitors |
BSR8 | P2-5 Solid Electrolytic Capacitors (Tantalum, Niobium, Aluminum) |
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5482 National Adoption of 10 IEC documents |
Proposed | P2-5 Solid Electrolytic Capacitors (Tantalum, Niobium, Aluminum) |
|
5488 National Adoption of 5 IEC documents |
Proposed | P2-5 Solid Electrolytic Capacitors (Tantalum, Niobium, Aluminum) |
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5489 Reaffirmation of EIA 60384-4 |
Proposed | P2-5 Solid Electrolytic Capacitors (Tantalum, Niobium, Aluminum) |
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5444 Review of J-STD-48 |
Proposed | S1 Steering Committee |
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5480 Rev of JS709 |
Commenting | S1 Steering Committee |
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5450 Rev of J-STD-002E Solderability Tests for Component Leads, Terminations, Lugs, Terminals and Wires |
Proposed | STC - Soldering Technology Committee |
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*Project Status Key Proposed – Project opened PINS – Project Initiation form submitted to ANSI Committee Ballot – informal ballot to collect comments/determine Reaffirmation or Revision BSR-8 – mandatory Public Review period (45 days) Commenting – comment collection on circulated document |
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